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 TLP106
TOSHIBA PHOTOCOUPLER GaAAs IRED & PHOTO-IC
TLP106
Intelligent Power Module Signal Isolation Industrial Inverters Motor Drive
The Toshiba TLP106 consists of a GaAAs light-emitting diode and an integrated high-gain, high-speed photo-detector. The TLP106 is suitable for isolating input control signals isolation to intelligent power modules. This unit is a 6-pin MFSOP. The detector has a totem pole output stage to provide source drive and sink drive and features a built-in Schmitt trigger. The detector IC has an internal shield that provides a guaranteed common-mode transient immunity of 10 kV/s. The TLP106 is of a buffer logic type. An inverter logic version, the TLP102, is also available. Buffer logic type (totem pole output) Guaranteed performance over temperature : -40~85C Power supply voltage: -0.5~20 V Input current: IFLH = 3 mA (Max.) Switching Time (tpLH/tpHL): 400 ns (Max.) Common-mode transient immunity : 10 kV/s Isolation voltage: 3750 Vrms TOSHIBA Weight: 0.09 g(typ.) 11-4C2 Unit in mm
Truth Table
Input H L LED ON OFF Tr1 ON OFF Tr2 OFF ON Output H L
Pin Configuration (Top View) 1
VCC
6 5
1:ANODE 3:CATHODE 4:GND 5:VO 6:VCC
3
GND SHIELD
4
Schematic
IF 1 VF 3 Tr2
I CC 6 Tr1 IO VO 5 VCC
SHIELD
4
GND
0.1 F bypass capacitor must be connected between pins 6 and 4
1
2007-10-01
TLP106
Recommended Operating Conditions
CHARACTERISTIC Input Current, ON Input Voltage, OFF Supply Voltage Operating Temperature SYMBOL IF (ON) VF (OFF) VCC Topr MIN. 5 0 4.5 -40 TYP. MAX. 10 0.8 20 85 UNIT mA V V C

Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document.
Absolute Maximum Ratings (Ta = 25C)
CHARACTERISTIC Forward Current LED Peak Transient Forward Current (Note 1) Reverse Voltage Output Current 1 (Ta 25C) DETECTOR Output Current 2 (Ta = 85C) Peak Output Current Output Voltage Supply Voltage Operating Temperature Range Storage Temperature Range Lead Solder Temperature (10 s) Isolation Voltage (AC, 1 min., R.H. 60%,Ta = 25C) (Note2) SYMBOL IF IFPT VR IO1 IO2 IOP VO VCC Topr Tstg Tsol BVs RATING 20 1 5 15/-15 4.5/-4.5 20/-20 -0.5~20 -0.5~20 -40~85 -55~125 260 3750 UNIT mA A V mA mA mA V V C C C Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Pulse width PW 10 us, 500 pps. Note 2: Product considered a two-terminal device: pins 1 and 3 shorted together and pins 4, 5 and 6 shorted together.
2
2007-10-01
TLP106
Electrical Characteristics (Unless otherwise specified, Ta = -40 to 85C, VCC = 4.5~20 V.)
CHARACTERISTIC Input Forward Voltage Temperature Coefficient of Forward Voltage Input Reverse Current Input Capacitance Logic LOW Output Voltage SYMBOL VF VF/Ta IR CT VOL TEST CIRCUIT CONDITION IF = 5 mA ,T a = 25C IF = 5 mA VR = 5 V, Ta = 25C V = 0, f = 1 MHz, Ta = 25C IOL = 3.5 mA, VF = 0.8 V IOH =-3.5 mA, VCC = 5 V IF = 5 mA VCC = 20 V VCC = 20 V, Logic LOW Supply Current ICCL 3 VF = 0 V Ta = -40~85C VCC = 5 V, Ta = 25C VCC = 20 V, Logic HIGH Supply Current ICCH 4 IF = 5 mA Ta =-40~85C VCC = 5 V, Ta = 25C Logic LOW Short Circuit Output Current Logic HIGH Short Circuit Output Current Input Current Logic HIGH Output Input Voltage Logic LOW Output Input Current Hysteresis IOSL 5 VF = 0 V VCC = VO = 20 V IF = 5 mA , VO = GND VCC = 20 V IO = -3.5 mA, VO > 2.4 V IO = 3.5 mA, VO < 0.4 V VCC = 5 V MIN. TYP. 1.5 -2.0 MAX. 1.7 UNIT V mV/C A pF V

1

2.4 17.4
10
30 0.1 3.1 18.1 4.0 3.6 3.1 2.8
0.35
Logic HIGH Output Voltage
VOH
2

6.0
V

7
mA 4.5 6.0 mA 4.5
37
mA
IOSH
6
-7
-40
3
mA
IFLH VFHL IHYS

0.8
0.3
mA V mA
0.05

*All typical values are at Ta = 25C.
Isolation Characteristics (Ta = 25C)
CHARACTERISTIC Capacitance Input to Output Isolation Resistance SYMBOL CS RS TEST CIRCUIT V = 0, f = 1 MHz R.H. 60%, VS = 500 V AC, 1 minute Isolation Voltage BVS AC, 1 second, in oil DC, 1 minute, in oil (Note 2) (Note 2) MIN. 1x10
12
TYP. 0.8 10
14
MAX.
UNIT pF Vrms Vdc
3750
10000 10000
3
2007-10-01
TLP106
Switching Characteristics (Unless otherwise specified, Ta = -40 to 85C, VCC = 4.5~20 V.
CHARACTERISTIC Propagation Delay Time to Logic HIGH Output Propagation Delay Time to Logic LOW Output Switching Time Dispersion between ON and OFF Output Rise Time Output Fall Time Propagation Delay Time to Logic HIGH Output Propagation Delay Time to Logic LOW Output Common-Mode Transient Immunity at HIGH Level Output Common-Mode Transient Immunity at LOW Level Output *All typical values are at Ta = 25C. CML CMH 9 VCM = 1000 Vp-p, IF = 0 mA, VCC = 20 V,Ta = 25C 10000 SYMBOL tpLH tpHL |tpHLtpLH| tr tf tpLH 8 tpHL IF = 50 mA VCM = 1000 Vp-p, IF = 5 mA, VCC = 20 V,Ta = 25C 50 7 TEST CIRCUIT CONDITION IF = 05mACL = 100 pF VCC = 20 V IF = 50 mACL = 100 F VCC = 20 V CL = 100 PF IF = 05 mA, VCC = 20 V IF = 50 mA, VCC = 20 V IF = 05 mA MIN. 50 50 TYP. 250 260 MAX. 400 400 350 UNIT ns ns ns ns ns ns ns

50
175 95

400 400

-10000
V/us
V/us
TEST CIRCUIT 1 : VOL
1 6 VCC 5 3 SHIELD GND 4 0.1uF VOL
V
TEST CIRCUIT 2 : VOH
IF 1 VCC 6 VCC 5 3 SHIELD GND 4
V
VOH
IOH VCC
I OL
0.1uF
TEST CIRCUIT 3 : ICCL
1 6 VCC 5 3 SHIELD GND 4
I CCL
A
TEST CIRCUIT 4 : ICCH
IF 1
VCC
6 5
I CCH
A
VCC
VCC
3 SHIELD
GND
4
TEST CIRCUIT 5 : IOSL
1 VCC 5 3 SHIELD GND 4 0.1uF
A
TEST CIRCUIT 6 : IOSH
IF
6
1 VCC
6 5 0.1uF
A
IOSL VO
VO VCC
VCC 3 SHIELD GND 4
IOSH
4
2007-10-01
TLP106
TEST CIRCUIT 7: Switching Time Test Circuit
IF VCC 0.1uF VO GND VCC CL
IF
tpLH VOH tpHL
50%
90%
SHIELD
VO
1.3V
VOL
10% tr tf
TEST CIRCUIT 8: Switching Time Test Circuit
VCC IF VCC 0.1uF 620 VOH GND CL 5k VO 5V
IF
tpLH tpHL
50%
90%
SHIELD
VO
1.3V
VOL
10% tr tf
CL: stray capacitance of probe and wiring (to 15 pF)
TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit
SW A B 3 SHIELD VC VCC 5 GND 4 0.1uF VO VCC
SW A : IF=5mA
IF
6
90%
1000
VCM
10%
tr
tf
CMH 17V V CML
VO
SW B : IF=0mA
CM
L
=
800(V ) t r (s)
CM
H
=
800(V ) t f (s)
5
2007-10-01
TLP106
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
6
2007-10-01


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